In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM) | Protocol (Translated to Danish)
Single Crystal Germanium Wafer med Orientering (110) 4°/12° ud mod
Optimering af eksponeringsfaktorer samt kobber filter til pædiatrisk bækkenprotokol på et digitalt radiografi system - PDF Free Download